Published in Ultramicroscopy by Giepmans group
14 November 2023
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Optical STEM detection for scanning electron microscopy Arent J. Kievits, B.H. Peter Duinkerken, Job Fermie, Ryan Lane, Ben N.G. Giepmans, Jacob P. Hoogenboom Ultramicroscopy, 256, February 2024, 113877 |
