Published in Microscopy and Microanalysis by the Giepmans group.
03 April 2025
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Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy
B H Peter Duinkerken, Arent J Kievits, Anouk H G Wolters, Daan van Beijeren Bergen en Henegouwen, Jeroen Kuipers, Jacob P Hoogenboom, Ben N G Giepmans Microscopy and Microanalysis, Volume 31, Issue 2, April 2025, ozaf024, https://doi.org/10.1093/mam/ozaf024
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